Micro cracks distribution and power degradation of polycrystalline solar cells wafer: Observations constructed from the analysis of 4000 samples

摘要: Abstract In this paper, the impact of Photovoltaic (PV) micro cracks is assessed through analysis 4000 polycrystalline silicon solar cells. The inspection has been carried out using an electron microscopy, which facilitate detection though acquisition both Everhart-Thornley Detector (ETD) and Back Scatted Electron Diffraction (BSED) image, where it was found that size are ranging from 50 μm to a maximum 4 mm. Micro have categorized into two main categories, including in cell front or rear contact. Several remarkable observations found, but not limited to, (i) output power loss due varies 0.9% 42.8%, subject crack type size, (ii) cells fingers reduce finger width, resulting increase by at least 1.7%, (iii) there substantial correlation between PV hot-spots presence cracks, while minimum temperature observed 7.6 °C.