Fast Hot Spot Evaluation

作者: F. Fertig , I. Geisemeyer , W. Warta , S. Rein , M.C. Schubert

DOI: 10.4229/EUPVSEC20142014-5DO.9.1

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参考文章(4)
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Otwin Breitenstein, Jan Bauer, Karsten Bothe, David Hinken, Jens Müller, Wolfram Kwapil, Martin C. Schubert, Wilhelm Warta, Can Luminescence Imaging Replace Lock-in Thermography on Solar Cells? IEEE Journal of Photovoltaics. ,vol. 1, pp. 159- 167 ,(2011) , 10.1109/JPHOTOV.2011.2169394
I. Geisemeyer, F. Fertig, W. Warta, S. Rein, M.C. Schubert, Prediction of silicon PV module temperature for hot spots and worst case partial shading situations using spatially resolved lock-in thermography Solar Energy Materials and Solar Cells. ,vol. 120, pp. 259- 269 ,(2014) , 10.1016/J.SOLMAT.2013.09.016