作者: Daihua Zhang , Zuqin Liu , Chao Li , Tao Tang , Xiaolei Liu
DOI: 10.1021/NL0489283
关键词: Nanowire 、 Reliability (semiconductor) 、 Transistor 、 Detection limit 、 Nanostructured materials 、 Fabrication 、 Chemistry 、 Sensitivity (electronics) 、 Nanotechnology 、 Oxide
摘要: We demonstrate detection of NO 2 down to ppb levels using transistors based on both single and multiple In 2 O 3 nanowires operating at room temperature. This represents orders-of-…