Inherent transmission probability limit between valence-band and conduction-band states and calibration of tunnel-FET parasitics

作者: A.S. Verhulst , D. Verreck , W.G. Vandenberghe , Q. Smets , M. Mohammed

DOI: 10.1109/E3S.2017.8246193

关键词: Probability limitValence bandConduction bandWKB approximationComputational physicsParasitic extractionQuantum tunnellingPath lengthPhysicsValence (chemistry)

摘要: Tunnel-FETs (TFETs) can achieve a subthreshold swing smaller than 60mV/dec and are considered as promising candidates for future low-power technology nodes [1-3]. The carrier injection into the channel of TFET occurs via band-to-band tunneling (BTBT) between valence- conduction-band states. Transmission probabilities these states be properly modeled using Wentzel-Kramers-Brillouin (WKB) approximation, provided changes in electrostatic potential small compared to length unit cell. However, tunnel path highly optimized TFETs is typically less 2 nm on-state WKB approximation at its limits. In particular, predictions 100% transmission probability lengths close /tun = 0 overestimated, since mismatch not taken account.

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