Anne S. Verhulst , W.G. Vandenberghe , Stefan De Gendt , Karen Maex
ieee silicon nanoelectronics workshop 1 -2
A.S. Verhulst , D. Verreck , W.G. Vandenberghe , Q. Smets
2017 Fifth Berkeley Symposium on Energy Efficient Electronic Systems & Steep Transistors Workshop (E3S) 1 -3
A.S. Verhulst , W.G. Vandenberghe , D. Leonelli , R. Rooyackers
device research conference 193 -196
Maarten Van de Put , William Vandenberge , Wim Magnus , Bart Soree
Wiiliam Vandenberghe
PhD Thesis
Jing Zhuge , Anne S Verhulst , William G Vandenberghe , Wim Dehaene
Semiconductor Science and Technology 26 ( 8) 085001
Mohammad Mahdi Khatami , Gautam Gaddemane , Maarten L Van de Put , Mohammad Kazem Moravvej-Farshi
Journal of Physics: Condensed Matter 32 ( 49) 495502
Sabyasachi Tiwari , Maarten L Van de Put , Bart Sorée , William G Vandenberghe
2D Materials 6 ( 2) 025011
Peter D Reyntjens , Sabyasachi Tiwari , Maarten L Van de Put , Bart Sorée
2D Materials 8 ( 2) 025009
Peter D Reyntjens , Sabyasachi Tiwari , Maarten L Van de Put , Bart Sorée
Materials 14 ( 15) 4167
Wenhao Liu , Mehrdad Rostami Osanloo , Xiqu Wang , Sheng Li
Physical Review B 104 ( 2) 024507
Emeric Deylgat , Sabyasachi Tiwari , William G Vandenberghe , Bart Sorée
Journal of Applied Physics 131 ( 23)
William G Vandenberghe , Mehrdad Rostami Osanloo
ACS Applied Electronic Materials 5 ( 2) 623 -631
Mohammad Mahdi Khatami , Maarten L Van de Put , William G Vandenberghe
Physical Review B 104 ( 23) 235424
Madhuchhanda Brahma , Maarten L Van de Put , Edward Chen , Massimo V Fischetti
npj 2D Materials and Applications 7 ( 1) 14
William G Vandenberghe
IEEE Nanotechnology Magazine 15 ( 6) 68 -C3
Sarah R Evans , Emeric Deylgat , Edward Chen , William G Vandenberghe
arXiv preprint arXiv:2301.05373
Sabyasachi Tiwari , Maarten L Van de Put , Kristiaan Temst , William G Vandenberghe
Physical Review Applied 19 ( 1) 014040
Emeric Deylgat , Edward Chen , Massimo V Fischetti , Bart Sorée
Solid-State Electronics 198 108458 -108458
Madhuchhanda Brahma , Maarten L Van de Put , Edward Chen , Massimo V Fischetti
2021 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) 175 -179