In Situ Microstructural Control and Mechanical Testing Inside the Transmission Electron Microscope at Elevated Temperatures

摘要: With atomic-scale imaging and analytical capabilities such as electron diffraction energy-loss spectroscopy, the transmission microscope has allowed access to internal microstructure of materials like no other microscopy. It been mostly a passive or post-mortem analysis tool, but that trend is changing with in situ straining, heating electrical biasing. In this study, we design demonstrate multi-functional microchip integrates actuators, sensors, heaters electrodes freestanding transparent specimens. addition mechanical testing at elevated temperatures, chip can actively control microstructures (grain growth phase change) specimen material. Using nano-crystalline aluminum, nickel zirconium materials, these novel inside microscope. Our approach active microstructural quantitative real-time visualization influence mechanistic modeling by providing direct accurate evidence fundamental mechanisms behind behavior.