Light-radiation-electricity conversion semiconductor device and application thereof

作者: 照二 長 , 純子 小波蔵 , Masashi Kondo , Yutaka Saito , Jiyunko Kobakura

DOI:

关键词: PIN diodep–n junctionOptoelectronicsSemiconductorMaterials scienceWaferSubstrate (electronics)Depletion regionImpuritySemiconductor device

摘要: PURPOSE:To enable a depletion layer to be optionally set in thickness matching the energy of radiation measure by method wherein planar type PIN diodes are laminated constitute new detecting device. CONSTITUTION:An N-type semiconductor substrate 1001 as first conductivity is provided with P -type impurity region 1002 second region. An N 1004 higher concentration than surface opposite its other on which provided, PN junction composed , -N and or so-called diode formed. By this setup, nearly equal length side device, can (a few mm tens cm, up maximum diameter wafer allowable an Si process) measure.

参考文章(6)
Miyake Kanichi, Kikuchi Kazunori, Tanaka Katsuaki, Miyagawa Hideaki, PRODUCTION OF WATERRRESISTANT ADHESIVE FOR CORRUGATED BOARD ,(1981)
Seiji Yamaguchi, Akira Usami, Yoshimarou Fujii, Silicon photodiode device and manufacture thereof ,(1982)
Shimada Yuki, Toyoda Taro, Onozuka Arata, Iwase Yoshitomo, LAMINATED RADIATION DETECTION ELEMENT ,(1988)