Nanoscale detection of a single fundamental charge in ambient conditions using the NV- center in diamond.

作者: Florian Dolde , Marcus W Doherty , Julia Michl , Ingmar Jakobi , Boris Naydenov

DOI: 10.1103/PHYSREVLETT.112.097603

关键词: Optical switchElectrometerPhysicsCharge (physics)Spin (physics)Center (category theory)Electric fieldAtomic physicsDiamondQubit

摘要: Single charge nanoscale detection in ambient conditions is a current frontier metrology that has diverse interdisciplinary applications. Here, such single demonstrated using two nitrogen-vacancy (NV) centers diamond. One NV center employed as sensitive electrometer to detect the change electric field created by displacement of electron resulting from optical switching other between its neutral ($\mathrm{NV}{}^{0}$) and negative ($\mathrm{NV}{}^{\ensuremath{-}}$) states. As consequence, our measurements also provide direct insight into dynamics inside material.

参考文章(49)
J. Martin, N. Akerman, G. Ulbricht, T. Lohmann, J. H. Smet, K. von Klitzing, A. Yacoby, Observation of electron–hole puddles in graphene using a scanning single-electron transistor Nature Physics. ,vol. 4, pp. 144- 148 ,(2008) , 10.1038/NPHYS781
C. Schönenberger, S. F. Alvarado, Observation of single charge carriers by force microscopy Physical Review Letters. ,vol. 65, pp. 3162- 3164 ,(1990) , 10.1103/PHYSREVLETT.65.3162
Michel H. Devoret, Robert J. Schoelkopf, Amplifying quantum signals with the single-electron transistor Nature. ,vol. 406, pp. 1039- 1046 ,(2000) , 10.1038/35023253
J. M. Elzerman, R. Hanson, L. H. Willems van Beveren, B. Witkamp, L. M. K. Vandersypen, L. P. Kouwenhoven, Single-shot read-out of an individual electron spin in a quantum dot. Nature. ,vol. 430, pp. 431- 435 ,(2004) , 10.1038/NATURE02693
Fernando Patolsky, Gengfeng Zheng, Charles M Lieber, Fabrication of silicon nanowire devices for ultrasensitive, label-free, real-time detection of biological and chemical species Nature Protocols. ,vol. 1, pp. 1711- 1724 ,(2006) , 10.1038/NPROT.2006.227
Yi Cui, Qingqiao Wei, Hongkun Park, Charles M Lieber, Nanowire Nanosensors for Highly Sensitive and Selective Detection of Biological and Chemical Species Science. ,vol. 293, pp. 1289- 1292 ,(2001) , 10.1126/SCIENCE.1062711
C. C. Williams, J. Slinkman, W. P. Hough, H. K. Wickramasinghe, Lateral dopant profiling with 200 nm resolution by scanning capacitance microscopy Applied Physics Letters. ,vol. 55, pp. 1662- 1664 ,(1989) , 10.1063/1.102312
Albert K. Henning, Todd Hochwitz, James Slinkman, James Never, Steven Hoffmann, Phil Kaszuba, Charles Daghlian, Two‐dimensional surface dopant profiling in silicon using scanning Kelvin probe microscopy Journal of Applied Physics. ,vol. 77, pp. 1888- 1896 ,(1995) , 10.1063/1.358819
Yves Martin, David W. Abraham, H. Kumar Wickramasinghe, High‐resolution capacitance measurement and potentiometry by force microscopy Applied Physics Letters. ,vol. 52, pp. 1103- 1105 ,(1988) , 10.1063/1.99224