Determining charge state of graphene vacancy by noncontact atomic force microscopy and first-principles calculations.

摘要: Graphene vacancies are engineered for novel functionalities, however, the charge state of these defects, key parameter that is vital to transfer during chemical reactions and carrier scattering, generally unknown. Here, we carried out atomic resolution imaging graphene vacancy defects created by Ar plasma using noncontact force microscopy, made first determination their local contact potential difference measurements. Combined with density functional theory calculations, show typically positively charged, size-dependent states not necessarily integer-valued. These findings provide new insights into scattering in graphene, as well its functionalization sensing catalysis, underline tunability functions controlling size defect.