Understanding the atomic-scale contrast in Kelvin probe force microscopy.
作者： Laurent Nony , Adam S. Foster , Franck Bocquet , Christian Loppacher
DOI: 10.1103/PHYSREVLETT.103.036802
关键词:
摘要: A numerical analysis of the origin atomic-scale contrast in Kelvin probe force microscopy is presented. Atomistic simulations tip-sample interaction field have been combined with a noncontact atomic microscope simulator including module. The implementation mimics recent experimental results on (001) surface bulk alkali halide crystal for which simultaneous topographical and contact potential difference contrasts were reported. local does reflect periodicity ionic crystal, but not magnitude its Madelung potential. imaging mechanism relies induced polarization ions at tip-surface interface owing to modulation applied bias voltage. Our findings are excellent agreement previous theoretical expectations observations.
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sci-hub.se 参考文章(19)
JMR Weaver, David W Abraham, High resolution atomic force microscopy potentiometry Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. ,vol. 9, pp. 1559- 1561 ,(1991) , 10.1116/1.585423
Shin’ichi Kitamura, Masashi Iwatsuki, High-resolution imaging of contact potential difference with ultrahigh vacuum noncontact atomic force microscope Applied Physics Letters. ,vol. 72, pp. 3154- 3156 ,(1998) , 10.1063/1.121577
Y. Rosenwaks, R. Shikler, Th. Glatzel, S. Sadewasser, Kelvin probe force microscopy of semiconductor surface defects Physical Review B. ,vol. 70, pp. 085320- ,(2004) , 10.1103/PHYSREVB.70.085320
Yasuhiro Sugawara, Takayuki Uchihashi, Masayuki Abe, Seizo Morita, True atomic resolution imaging of surface structure and surface charge on the GaAs(110) Applied Surface Science. ,vol. 140, pp. 371- 375 ,(1999) , 10.1016/S0169-4332(98)00557-1
Shin'ichi Kitamura, Katsuyuki Suzuki, Masashi Iwatsuki, C.B Mooney, Atomic-scale variations in contact potential difference on Au/Si(111) 7×7 surface in ultrahigh vacuum Applied Surface Science. ,vol. 157, pp. 222- 227 ,(2000) , 10.1016/S0169-4332(99)00530-9
Yasuhiro Sugawara, Seizo Morita, Kenji Okamoto, Kentaro Yoshimoto, KPFM imaging of Si(1 1 1)-Sb surface for atom distinction using NC-AFM Applied Surface Science. ,vol. 210, pp. 128- 133 ,(2003) , 10.1016/S0169-4332(02)01492-7
F. Krok, K. Sajewicz, J. Konior, M. Goryl, P. Piatkowski, M. Szymonski, Lateral resolution and potential sensitivity in Kelvin probe force microscopy: Towards understanding of the sub-nanometer resolution Physical Review B. ,vol. 77, pp. 235427- ,(2008) , 10.1103/PHYSREVB.77.235427
K. Wandelt, The local work function : Concept and implications international vacuum electron sources conference. ,vol. 111, pp. 1- 10 ,(1997) , 10.1016/S0169-4332(96)00692-7
Franck Bocquet, Laurent Nony, Christian Loppacher, Thilo Glatzel, Analytical Approach to the Local Contact Potential Difference on (001) Ionic Surfaces:~Implications for Kelvin Probe Force Microscopy Physical Review B. ,vol. 78, pp. 035410- ,(2008) , 10.1103/PHYSREVB.78.035410
Laurent Nony, Franck Bocquet, Christian Loppacher, Thilo Glatzel, On the relevance of the atomic-scale contact potential difference by amplitude-modulation and frequency-modulation Kelvin probe force microscopy Nanotechnology. ,vol. 20, pp. 264014- ,(2009) , 10.1088/0957-4484/20/26/264014