Effect of surface contact potential in atomic-size contacts
作者： C. Rackson , A. Watt , W.J. Kim
DOI: 10.1016/J.PHYSLETA.2015.07.005
关键词: Conductance 、 Surface (mathematics) 、 Current (fluid) 、 Nanotechnology 、 Capacitive coupling 、 Kelvin probe force microscope 、 Physics 、 Metal 、 Break junction 、 Condensed matter physics 、 Atomic radius
摘要: Abstract We present a study of the effect surface contact potential in mechanical break junction experiment. Using amplitude-modulated Kelvin probe microscopy (KPM), we show that real metal is highly non-uniform and strongly distance-dependent. Based on our KPM results, propose model which current induced from capacitive coupling accounts for much observed shifts conductance peaks integer multiples. The significance results other areas physics also discussed.
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