Qualification testing of thin-film and crystalline photovoltaic modules

作者: J BURDICK , J PRUETT , E BECK

DOI: 10.1016/0927-0248(95)00118-2

关键词: Reliability (semiconductor)Test (assessment)Computer scienceField (computer science)Qualification testingReliability engineeringRenewable energyPhotovoltaic systemTest sequenceService (systems architecture)

摘要: Abstract The results of the first complete module qualification testing performed on photovoltaic (PV) modules several different manufacturers and a variety technologies are presented here. Both thin-film crystalline PV being evaluated. National Renewable Energy Laboratory (NREL) now has capability to perform all tests in proposed IEEE test sequence. Each will be discussed. In addition, we have developed new methods improved techniques as well engineering solutions problems encountered with some present procedures. This work not only demonstrates NREL's continuing commitment interact improve their from both performance reliability standpoint, but also shows ongoing effort validate ASTM Finally, this kind research is needed before further studies correlation between indoor, accelerated outdoor, real-world exposure can made, hope eventually predicting long-term service lifetimes field.

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