Rietveld refinement of Debye–Scherrer synchrotron X‐ray data from Al2O3

作者: P. Thompson , D. E. Cox , J. B. Hastings

DOI: 10.1107/S0021889887087090

关键词: Computational physicsMonochromatorPhysicsResolution (electron density)Analytical chemistryGaussianCrystalBragg's lawDebyeSynchrotronRietveld refinement

摘要: … a capillary sample of Al 2 O 3 in Debye-Scherrer geometry is described. The data were obtained … In conclusion, it appears that the Debye-Scherrer method coupled with a perfect-crystal …

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