Analysis of the elements sputtered during the lanthanum implantation in stainless steels
作者： F.J Ager , M.A Respaldiza , A Paúl , J.A Odriozola , J.M Lobato
DOI: 10.1016/S0168-583X(97)00967-1
关键词: Lanthanum 、 Thermogravimetric analysis 、 Metallurgy 、 Surface structure 、 Ion 、 Carbon 、 Sputtering 、 Materials science
摘要: Abstract The evidence of the modification surface structure AISI-304 stainless steel during implantation lanthanum makes analysis sputtered elements very interesting. Those are deposited on a carbon sheet placed in front being implanted, and studied by means RBS PIXE, together with implanted specimens. Besides, protective effect ions high temperature oxidation is also those techniques XRD thermogravimetric methods.
elsevier.com
sci-hub.se 参考文章(3)
Lawrence R. Doolittle, Algorithms for the rapid simulation of Rutherford backscattering spectra Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. ,vol. 9, pp. 344- 351 ,(1985) , 10.1016/0168-583X(85)90762-1
F.J. Ager, M.A. Respaldiza, J. Botella, J.C. Soares, M.F. da Silva, J.J. Benítez, J.A. Odriozola, Rutherford backscattering spectrometry (RBS) characterization of oxide scale formed on (AISI-304) steel after surface deposition of lanthanum Acta Materialia. ,vol. 44, pp. 675- 681 ,(1996) , 10.1016/1359-6454(95)00193-X
J.A. Maxwell, J.L. Campbell, W.J. Teesdale, The Guelph PIXE software package II Nuclear Instruments & Methods in Physics Research Section B-beam Interactions With Materials and Atoms. ,vol. 43, pp. 3356- 3363 ,(1989) , 10.1016/0168-583X(89)90042-6