Study on Nonvolatile Memory Based on Electric‐Pulse‐Induced Reversible Resistance Change Effect
作者： Qun Wang , Lidong Chen , Rui Dong , Dashan Shang , Xiaomin Li
DOI: 10.1002/9781118144121.CH52
关键词: Field emission scanning electron microscopy 、 Materials science 、 Nanotechnology 、 Electric pulse 、 Non-volatile memory
摘要:
sci-hub.st 参考文章(15)
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