Method of grinding rear side of semiconductor wafer

作者: Kazuhisa Arai

DOI:

关键词: Materials scienceWafer backgrindingElectronic circuitWaferSemiconductorOptoelectronicsGrindingCoatingEngineering drawingResist

摘要: A method of grinding the rear side a semiconductor wafer, front which has bumps formed thereon, includes steps of: preparing wafers whose surfaces have plurality circuits in their lattice patterns; coating selected wafer with resist material to form layer thereon; forming holes each section at are be corresponding by removing resist; plating metal bumps; putting on chuck table layer, is its side, laid machine; and wafer. The lower than thickness therefore, they short reaching surface can protected from cracking, otherwise would caused concentration stress while thereof.

参考文章(4)
Thomas D. Palella, Myron Levine, William N. Kelley, Viral-mediated gene transfer system ,(1994)
Michihiro Kobiki, Masahiro Yoshida, Takahide Ishikawa, Method of producing a field effect transistor ,(1994)