Raman scattering for lead telluride-based thin film structures
作者： S. P. Zimin , E. S. Gorlachev , A. V. Baranov , S. A. Cherevkov , E. Abramof
DOI: 10.1134/S0030400X14110241
关键词: Wavelength 、 Raman scattering 、 Materials science 、 Raman spectroscopy 、 Atomic physics 、 Spectral line 、 Lead telluride 、 Thin film 、 Phonon 、 Optics 、 Spectrometer
摘要: For single-crystal epitaxial lead telluride films, Raman spectra obtained under conditions in which the intensity of incident radiation is minimized order to suppress photo-initiated oxidative process are presented. The were measured with an InVia Renishaw spectrometer at exciting wavelength 514.5 nm and in-line focusing a 20-μW beam. These measuring allowed us for first time experimentally observe large set peaks telluride, positions line theoretical values harmonics combinatorial PbTe phonon modes. In demonstrate possibilities methodology used, picture modes polycrystalline films Pb1 − x Eu Te (0.05 ⩽ 0.10) solution was additionally considered.
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