Measurement of roughness based on the Talbot effect in reflection from rough surfaces.

作者: Masoomeh Dashtdar , Ali Mohammadzade , S. Mohammad-Ali Hosseini-Saber

DOI: 10.1364/AO.54.005210

关键词: Surface finishMaterials scienceRefractive indexAngle of incidence (optics)Talbot effectSurface roughnessOpticsReflection (physics)GratingLight scattering

摘要: In the present work, Talbot effect of a square grating is analyzed when light reflected from rough surface. It shown theoretically that scattered intensity in Fresnel diffraction limit depends on statistical properties surface, angle incidence light, period, and geometric coefficient, related to ratio distance surface observation plane grating. At distances grating, height difference function, terms multiplication number, coefficient modulation transfer function (MTF) scattering reflection If argument larger than twice correlation length, constant for different spatial frequencies. Therefore, wave reproduced with smaller contrast. The roughness can be obtained by measuring contrast at incident angles. also measurements both transmission, provide refractive index transparent samples experimental studies, three metal standard surfaces are determined angles incidence. Also, sheet glass obtained. results quite consistent.

参考文章(40)
Krzysztof Patorski, I The Self-Imaging Phenomenon and its Applications Progress in Optics. ,vol. 27, pp. 1- 108 ,(1989) , 10.1016/S0079-6638(08)70084-2
Karl H. Guenther, Peter G. Wierer, Jean M. Bennett, Surface roughness measurements of low-scatter mirrors and roughness standards Applied Optics. ,vol. 23, pp. 3820- 3836 ,(1984) , 10.1364/AO.23.003820
M.T Tavassoly, A simple method for measuring the refractive index of a plate Optics and Lasers in Engineering. ,vol. 35, pp. 397- 402 ,(2001) , 10.1016/S0143-8166(01)00019-7
Eric Chason, Michael B Sinclair, Jerry A Floro, John A Hunter, Robert Q Hwang, None, Spectroscopic light scattering for real-time measurements of thin film and surface evolution Applied Physics Letters. ,vol. 72, pp. 3276- 3278 ,(1998) , 10.1063/1.121622
C. Rockstuhl, S. Fahr, K. Bittkau, T. Beckers, R. Carius, F.-J. Haug, T. Söderström, C. Ballif, F. Lederer, Comparison and optimization of randomly textured surfaces in thin-film solar cells. Optics Express. ,vol. 18, ,(2010) , 10.1364/OE.18.00A335
S. Arhab, G. Soriano, K. Belkebir, A. Sentenac, H. Giovannini, Full wave optical profilometry. Journal of The Optical Society of America A-optics Image Science and Vision. ,vol. 28, pp. 576- 580 ,(2011) , 10.1364/JOSAA.28.000576
W. T. Welford, Optical estimation of statistics of surface roughness from light scattering measurements Optical and Quantum Electronics. ,vol. 9, pp. 269- 287 ,(1977) , 10.1007/BF00619527
Tanos Mikhael Elfouhaily, Charles-Antoine Guérin, A critical survey of approximate scattering wave theories from random rough surfaces Waves in Random Media. ,vol. 14, ,(2004) , 10.1088/0959-7174/14/4/R01