Validation of kinematically simulated pattern HR-EBSD for measuring absolute strains and lattice tetragonality
作者： David Fullwood , Mark Vaudin , Craig Daniels , Timothy Ruggles , Stuart I. Wright
DOI: 10.1016/J.MATCHAR.2015.07.017
关键词: Electron backscatter diffraction 、 Optical distortion 、 Microscope 、 Strain mapping 、 Standard material 、 Algorithm 、 Reference patterns 、 Cross-correlation 、 Materials science 、 Crystallography 、 Lattice (order)
摘要: … high-resolution EBSD (HR-EBSD; the high resolution refers … the simulated pattern approach to HR-EBSD, and its sensitivity … The basic idea of HR-EBSD is to determine the distortion that …
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