作者: Sang Han Park , Jimin Chae , Kwang Sik Jeong , Tae-Hyeon Kim , Hyejin Choi
DOI: 10.1021/ACS.NANOLETT.5B00553
关键词: Fermi level 、 Topological order 、 Transmittance 、 Scattering 、 Topological insulator 、 Density functional theory 、 Condensed matter physics 、 Spectroscopy 、 Materials science 、 Surface (mathematics)
摘要: For three-dimensional (3D) topological insulators that have a layered structure, strain was used to control critical physical properties. Here, we show tensile decreases bulk carrier density while accentuating transport of surface state using temperature-dependent resistance and magneto-resistance measurements, terahertz-time domain spectroscopy functional theory calculations. The induced confirmed by transmittance X-ray scattering measurements. results the possibility reversible device structural deformation.