Imaging and Microanalysis of Non-Conducting Materials in the Lowvoltage FE-SEM: Challenges and Strategies
作者： Jingyue Liu , None
DOI: 10.1017/S1431927600036266
关键词: Metallurgy 、 Materials science 、 Microanalysis
摘要:
harvard.edu
sci-hub.st 参考文章(3)
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J. Liu, Image Formation With Upper and Lower Secondary Electron Detectors in the Low Voltage Field-Emission SEM Microscopy and Microanalysis. ,vol. 4, pp. 260- 261 ,(1998) , 10.1017/S1431927600021425