Reduction of overhead in adaptive body bias technology due to triple-well structure based on measurement and simulation

作者: Yasuhiro Ogasahara , Toshihiro Sekigawa , Masakazu Hioki , Tadashi Nakagawa , Toshiyuki Tsutsumi

DOI: 10.1109/ICMTS.2015.7106154

关键词: Structure basedReduction (complexity)EngineeringProcess (computing)VoltageOverhead (computing)Device simulationElectronic engineering

摘要: This paper presents the significant reduction of area overhead due to triple-well structure for adaptive body bias methods. Triple-well TEGs which include violation design rules originating from voltage tolerance were implemented on a 65nm process. Reexamining based measurement results reduced deep n-wells spacing by 60% A new method further is proposed device simulation validated with results.

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