作者: Lucia V. Mercaldo , Iurie Usatii , Emilia M. Esposito , Paola Delli Veneri , Jan-Willem Schüttauf
DOI: 10.1002/PIP.2743
关键词: Dielectric 、 Optoelectronics 、 Thin film 、 Surface finish 、 Solar cell 、 Layer (electronics) 、 Electrode 、 Texture (crystalline) 、 Raman spectroscopy 、 Materials science
摘要: Thin-film Si solar cells employ a back reflector (BR) for more efficient use of the long wavelength light. Here, we have carried out cross evaluation metal (Ag-based) and dielectric (white paint-based) BR designs. Conclusive results been reached regarding most suitable type depending on front electrode morphology, both with crater-like pyramidal texture. The ZnO/Ag is found to be optically because improved light trapping, although gain tends vanish rougher electrodes. Thanks non-conventional Raman intensity measurements, this dependence texture has linked different weight interfaces in trapping process morphologies. With substrates, minor optical accompanied by sputter-induced electronic deterioration cell during ZnO buffer layer deposition, white paint-based design preferred. Copyright © 2016 John Wiley & Sons, Ltd.