A focusing X-ray polarizer for energy-dispersive analysis

作者: Poen S. Ong , John N. Randall

DOI: 10.1002/XRS.1300070411

关键词: DiffractionDetection limitBrewster's angleRadiationMaterials scienceSpectrum analyzerOpticsCrystalPolarizerX-raySpectroscopy

摘要: The Properties of diffracting crystals a Bragg and near 45° are studied for use as an X-ray polarizer. Such have many advantages over the Barkla type polarizer when used in energy-dispersive analyzer. study shows that matching λ-d combinations available, but present work was done with LiF (200). With this crystal, second order diffraction Cu Kβ radiation occurs at 43.67° improvement peak to background ratio by factor 45 obtained. revealed substantial minimum detection limit can be obtained larger deviation polarization angle, long is accompanied higher output.

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