A single-exposure method for the determination of lattice spacings and crystal orientation from Kossel diffraction patterns

作者: N. Harris , A. J. Kirkham

DOI: 10.1107/S0021889871006757

关键词: Arithmetic functionCoordinate systemLattice (order)DiffractionComputer programGeometryOpticsWavelengthRadiationMaterials scienceLattice constant

摘要: A single exposure method is described for the calculation of lattice spacings and crystal orientation, from Kossel diffraction patterns. This extremely simple an experimental viewpoint since only data required are coordinates five or more points on each curve in arbitrary orthogonal system wavelength characteristic X-ray radiation forming pattern. The requires analysis at least two curves which can be either elliptical hyperbolic. equation first derived system. It then transformed to a coordinate coefficients may equated with those same terms spacing, orientation planes responsible cone wavelength. directions plane normals calculated. computer program has been written handle lengthy arithmetical operations analysis, application pattern grain Swedish iron described.

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