Application of the Kossel X-ray technique for obtaining crystallographic data in the scanning electron microscope

摘要: Abstract The divergent beam back reflection X-ray technique, known as Kossel diffraction, has been successfully applied in the scanning electron microscope. A simple camera is described which enables patterns to be recorded with minimal alteration of independent specimen stage controls and does not interfere normal operation technique for obtaining a typical pattern from iron reproduced illustrate signal noise ratio. Results experiments determine exposure time function film speed are included.