Precise determination of residual stresses in FeSi3 electrical sheets in the vicinity of laser scratches with high lateral resolution
作者： M. Böhling , J. Bauch
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摘要: States of residual stress in laser scribed FeSi3 electrical sheets the vicinity scratch have been investigated. The influence treatment on distortion crystal lattice was not only determined qualitatively but also quantitatively. Residual stresses third kind were determined. maps recorded showing clearly state as well formation domain structure FeSi3. dislocation densities and states could be spots micrometer size. This made possible by coupling KOSSEL electron backscatter diffraction (EBSD) techniques one device at high lateral resolution. (© 2007 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)
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