High-k metal gate devices with a dual work function and methods for making the same

作者: Liang-Gi Yao , Cheng-Tung Lin , Chen-Hua Yu

DOI:

关键词: NanotechnologySemiconductor deviceOptoelectronicsMaterials scienceDual (category theory)High-κ dielectricWork functionDielectric layerLayer (electronics)

摘要: A layer of P-metal material having a work function about 4.3 or 4.4 eV less is formed over high-k dielectric layer. Portions the N-metal are converted to materials by introducing additives such as O, C, N, Si others produce an increased 4.7 4.8 greater. TaC film may be TaCO, TaCN, TaCON using this technique. The including original portions and then patterned single patterning operation simultaneously form semiconductor devices from both unconverted sections sections.

参考文章(8)
Tzu-Shih Yen, Hao-Chieh Liu, Hung-Yi Luo, Erik S. Jeng, Method for forming self-aligned contacts using a hard mask ,(1999)
Fenton McFeely, Paul Jamison, John Yurkas, Cyril Cabral, Matthew Copel, Edmund Sikorskii, Keith Milkove, Vijav Narayanan, Elizabeth Duch, Kazuhito Nakamura, Roy Carruthers, Sufi Zafar, Alessandro Callegari, CVD tantalum compounds for FET gate electrodes ,(2004)
Vidya S Kaushik, Bich-Yen Nguyen, James K Schaeffer, Tat Ngai, Semiconductor device and a method therefor ,(2002)
Periannan Chidambaram, Srinivasan Charkravarthi, Highly activated carbon selective epitaxial process for CMOS ,(2005)
Dae-Gyu Park, Cyril Cabral, Oleg Gluschenkov, Hyungjun Kim, Temperature stable metal nitride gate electrode ,(2004)
Husam Alshareef, Seung-Chul Song, Muhammad Hussain, Hongfa Luan, Joel Barnett, Raj Jammy, Naim Moumen, Dual Metal Gate and Method of Manufacture ,(2006)