Structure and transport properties of current-perpendicular-to-plane spin valves using Co2FeAl0.5Si0.5 and Co2MnSi Heusler alloy electrodes
作者： T. Furubayashi , K. Kodama , T. M. Nakatani , H. Sukegawa , Y. K. Takahashi
DOI: 10.1063/1.3431530
关键词: Transmission electron microscopy 、 Magnetoresistance 、 Layer (electronics) 、 Substrate (electronics) 、 Electrode 、 Sputter deposition 、 Materials science 、 Analytical chemistry 、 Alloy 、 Metallurgy 、 Epitaxy
摘要: We report the structure and transport properties of current-perpendicular-to-plane spin valves (CPP SVs) with Co2FeAl0.5Si0.5 (CFAS) or Co2MnSi (CMS) Heusler alloy magnetic layers an Ag Cu spacer layer. A multilayer stack sub/Cr/Ag/Heusler/(Ag Cu)/ Heusler/Co75Fe25/Ir22Mn78/Ru was deposited on a MgO(001) single crystalline substrate by magnetron sputtering. Transmission electron microscopy observations showed epitaxial growth from to top The CPP SV CFAS/Ag/CFAS trilayer relatively large magnetoresistance (MR) ratios 12% at room temperature 31% 12 K, monotonous dependence. However, MR values CMS/Ag/CMS different dependence maximum value 22% 100 K. This might be related 90° couplings between two CMS layers.
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