Preparation and characterization of sprayed FTO thin films
作者： M. Abd-Lefdil , R. Diaz , H. Bihri , M. Ait Aouaj , F. Rueda
关键词: Mineralogy 、 Sheet resistance 、 Analytical chemistry 、 Scanning electron microscope 、 Materials science 、 Electrical resistivity and conductivity 、 Doping 、 Annealing (metallurgy) 、 Tin oxide 、 Thin film 、 Tetragonal crystal system
摘要: Fluorine doped tin oxide (FTO) thin films have been prepared by spray pyrolysis technique with no further annealing. Films 2.5% of fluorine grown at 400 °C present a single phase and exhibit tetragonal structure lattice parameters = 4.687 A c 3.160 A. Scanning electron micrographs showed homogeneous surfaces average grain size around 190 nm. The are transparent in the visible zone high reflectance near infrared region. best electrical resistivity was 6.3 × 10 -4 Ω cm for FTO fluorine. ratio transmittance to sheet resistance 0.57 -2 –1.96 Ω -1 range.
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