A structural and optical study of sputtered InP films as a function of preparation temperature
作者： S H Baker , S C Bayliss , S J Gurman , N Elgun , E A Davis
DOI: 10.1088/0953-8984/8/10/028
关键词: Amorphous solid 、 Absorption edge 、 Analytical chemistry 、 Extended X-ray absorption fine structure 、 Absorption (electromagnetic radiation) 、 Absorption spectroscopy 、 Photon energy 、 Chemistry 、 Atmospheric temperature range 、 X-ray photoelectron spectroscopy
摘要: Approximately stoichiometric InP films have been prepared over a range of substrate temperature . The structure the deposited has investigated by means transmission electron microscopy (TEM), extended x-ray absorption fine (EXAFS) and photoelectron spectroscopy (XPS) experiments. TEM measurements reveal that samples below approximately are amorphous while above this microcrystalline in nature. Both EXAFS XPS indicate bond angle disorder atomic network decreases as is raised. Changes optical properties observed increased, with particularly marked changes noted relatively narrow ; bandgap (defined photon energy at which coefficient equal to ) increases from 1.1 1.25 eV n(0.5) (the refractive index 0.5 energy) 3.7 3.3 range. correlated structural data.
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