The matching of small capacitors for analog VLSI
作者： B.A. Minch , C. Diorio , P. Hasler , C. Mead
DOI: 10.1109/ISCAS.1996.539873
关键词: Threshold voltage 、 Electrical engineering 、 Very-large-scale integration 、 Physics 、 Optoelectronics 、 Capacitor 、 Analog computer 、 Switched capacitor 、 Standard deviation 、 Analogue electronics 、 CMOS
摘要: The capacitor has become the dominant passive component for analog circuits designed in standard CMOS processes. Thus, matching is a primary factor determining precision of many circuit techniques. In this paper, we present experimental measurements mismatch between square capacitors ranging size from 6 /spl mu/m/spl times/6 mu/m to 20 times/20 fabricated 2 double-poly process available through MOSIS. For mu/m, have found that those fell within one deviation mean matched better than 1%. size, observed 1 about 0.2%. Finally, effect nonidentical surrounds on matching.
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