Enhanced-Performance Germanium Nanowire Tunneling Field-Effect Transistors Using Flash-Assisted Rapid Thermal Process

作者: Junghyo Nah , En-Shao Liu , Kamran M. Varahramyan , Dave Dillen , Steve McCoy

DOI: 10.1109/LED.2010.2072770

关键词: NanotechnologyDopantNanowireDopant ActivationMaterials scienceField-effect transistorGermaniumOptoelectronicsRapid thermal processingTunnel junctionSubthreshold conduction

摘要: We report the enhanced performance of Ge nanowire (NW) tunneling field-effect transistors (TFETs), realized using a millisecond flash-assisted rapid thermal process (fRTP) for dopant activation. The electrical characteristics our fRTP-activated NW TFETs exhibit maximum drive currents up toImax ~ 28 μA/μm at Vdd = -3 V and improved subthreshold swings. By comparison, conventional RTP activation show an order magnitude lower current. attribute these findings to more abrupt doping profile tunnel junction, owing reduced diffusion

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