Application of the Scanning Kelvin Probe Technique for Characterization of Corrosion Interfaces
作者： B. Łosiewicz , Magdalena Popczyk , Magdalena Szklarska , Agnieszka Smołka , Patrycja Osak
DOI: 10.4028/WWW.SCIENTIFIC.NET/SSP.228.369
关键词: Work function 、 Corrosion 、 Materials science 、 Nanotechnology 、 Conductor 、 Dielectric 、 Kelvin probe force microscope 、 Nanoscopic scale 、 Semiconductor 、 Characterization (materials science) 、 Optoelectronics
摘要: This paper deals with the basic theory and the usability of the scanning Kelvin probe (SKP) being a non-destructive, non-contact method for testing the condition of the surface of conductor, semiconductor and dielectric samples. This technique is based on the electron work function (EWF) characteristic of various test substances and depends, inter alia, on the sample surface condition. During measurement, the so-called surface potential distribution map containing information about EWF value is registered. Key applications of SKP and its various modifications to characterization of corrosion interfaces, have been presented based on the newest literature data covering the past two years of the active research in the field of corrosion in a nanoscale.
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