作者: L. Piperno , A. Vannozzi , V. Pinto , A. Angrisani Armenio , F. Rondino
DOI: 10.1016/J.APSUSC.2020.146402
关键词: Optical microscope 、 Transmission electron microscopy 、 Texture (crystalline) 、 Substrate (electronics) 、 Strontium titanate 、 X-ray photoelectron spectroscopy 、 Secondary ion mass spectrometry 、 Thin film 、 Materials science 、 Analytical chemistry
摘要: Abstract In this work it is shown how SrTiO3 substrates interact with YBa2Cu3O7-δ thin films during film processing. The effect of interdiffusion on morphology and transport properties analyzed. were deposited by low fluorine Metal Organic Decomposition (MOD) (0 0 1) single crystals. general, a sharp c-axis oriented growth high critical temperature (Tc) observed in all samples; however, the surface otherwise good-quality spoiled presence inhomogeneous circular areas seemingly different appearance texture. order to understand nature these defects, deeply investigated optical microscopy, scanning transmission electron microscopy (SEM, TEM), X-ray diffraction (XRD), photoelectron spectroscopy (XPS), contact-stylus profilometry (SSP), Atomic Force Microscopy (AFM) time flight secondary ion mass spectrometry (ToF-SIMS). round spots are manifestation, surface, from substrate into YBCO Spot-free samples can be obtained pre-treatments substrates. Although defects detrimental for local structure, Jc values not significantly affected, although defects' influence might become substantial while working smaller scales.