Wrap-around gate field effect transistor

作者: Mark Charles Hakey , Charles William Koburger , Peter H. Mitchell , Toshiharu Furukawa , David Vaclav Horak

DOI:

关键词: Silicon on insulatorField-effect transistorGate oxideGate dielectricElectrical engineeringSiliconMaterials scienceConductorElectrodeMetal gateOptoelectronics

摘要: A field effect transistor is formed having wrap-around, vertically-aligned, dual gate electrodes. Starting with an silicon-on-insulator (SOI) structure a buried silicon island, vertical reference edge defined, by creating cavity within the SOI structure, and used during two etch-back steps that can be reliably performed. The first removes portion of oxide layer for distance over which conductor material then applied. second distance. difference between distances defines length eventual device. After stripping away layers, electrode revealed surrounds island on all four side surfaces.

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