Analysis of electron energy-loss spectra from electron-beam-damaged amorphous AIF3

作者: C. A. Walsh

DOI: 10.1080/01418618908205056

关键词: ExcitationAmorphous solidThin filmOpticsChemistryCoaxialMolecular physicsScanning transmission electron microscopyAluminiumElectronCathode ray

摘要: Abstract Expressions for the electron energy-loss probability are obtained electrons travelling parallel to, firstly, one and, secondly, two coaxial cylindrical interfaces between different media. These expressions have been evaluated Al-vacuum confirming that modes behave in manner expected. Experimental spectra presented through holes drilled thin films of amorphous AIF3 (a-A1F3) a scanning transmission microscope. Comparison these with calculated indicates discrepancy shape which is attributed to modification a-A1F3 surrounding hole. The presence 6 eV peak some excitation surface mode on spheres aluminium film.

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