作者: M. Lavagna , J.P. Pique , Y. Marfaing
DOI: 10.1016/0038-1101(77)90190-3
关键词: Quantum yield 、 Photoelectric effect 、 Schottky barrier 、 Charge carrier 、 Depletion region 、 Optoelectronics 、 Metal–semiconductor junction 、 Electric field 、 Atomic physics 、 Schottky diode 、 Materials science
摘要: Abstract A detailed analytical calculation of the photoelectric quantum yield in Schottky diodes is presented. The transport carriers surface space charge region treated explicitly, taking account photogeneration, diffusion and drift non-uniform electric field. Boundary conditions at interface are expressed terms recombination velocity emission excess into metal. It shown that metal-semiconductor strongly affects collection efficiency short wavelength generated electron-hole pairs. This effect basically originates flux majority Current, distributions yields computed using data AuCdTe barriers.