Theoretical analysis of the quantum photoelectric yield in Schottky diodes

作者: M. Lavagna , J.P. Pique , Y. Marfaing

DOI: 10.1016/0038-1101(77)90190-3

关键词: Quantum yieldPhotoelectric effectSchottky barrierCharge carrierDepletion regionOptoelectronicsMetal–semiconductor junctionElectric fieldAtomic physicsSchottky diodeMaterials science

摘要: Abstract A detailed analytical calculation of the photoelectric quantum yield in Schottky diodes is presented. The transport carriers surface space charge region treated explicitly, taking account photogeneration, diffusion and drift non-uniform electric field. Boundary conditions at interface are expressed terms recombination velocity emission excess into metal. It shown that metal-semiconductor strongly affects collection efficiency short wavelength generated electron-hole pairs. This effect basically originates flux majority Current, distributions yields computed using data AuCdTe barriers.

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