DOSE DEPENDENCE OF RADIATION INDUCED DAMAGE IN THE THERMOLUMINESCENT RESPONSE OF LIF:Mg,Ti (TLD-100).
作者： G Reshes , S Biderman , Y S Horowitz , L Oster , I Eliyahu
DOI: 10.1093/RPD/NCZ280
关键词: Sensitivity (electronics) 、 Radiation induced 、 Materials science 、 Radiochemistry 、 Dose dependence 、 Irradiation 、 Thermoluminescent dosimeter 、 Thermoluminescence
摘要: The effect of previous irradiation on the sensitivity glow peaks LiF:Mg,Ti (TLD-100) is investigated up to levels dose 400 Gy in both slow-cooled and naturally cooled materials following 400°C/1 hour pre-irradiation anneal. It demonstrated that samples can be re-used accumulated 50 Gy without recalibration. At a significant decrease approximately 25% observed for all (excluding peak 3). In even 100 Gy does not alter material.
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