X-ray topography studies on the influence of the mass-loading effect on resonator parameters
作者： I. Mateescu , B. Capelle , J. Detaint , L. Dumitrache
关键词: Quartz 、 Electrical measurements 、 Electrode 、 Synchrotron radiation 、 Diffraction 、 Inductance 、 Q factor 、 Optics 、 Materials science 、 Resonator
摘要: In this paper the results of electrical measurements mass-loading influence on AT-cut quartz resonator parameters are compared with those obtained by X-ray topography analysis same resonators. Based Ballato's transmission-line analogs trapped-energy resonators vibrating in thickness-shear mode, effect characteristics was studied and effective mass-loading, motional inductance quality factor were computed. performed transmission diffraction using synchrotron radiation. Sawyer plan-parallel polished AT 14 mm diameter, 5 MHz frequency, Au electrodes various structures, diameters thickness used experiments. The investigations agreement previous ones measurements.
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