作者: J. Voss , M. Fornefett , C. Kunz , A. Moewes , M. Pretorius
DOI: 10.1016/0368-2048(96)02986-6
关键词: Luminescence 、 Photoelectric effect 、 Spectroscopy 、 Ceramic 、 Nanotechnology 、 Optoelectronics 、 Porous silicon 、 Materials science 、 Microscope 、 Photon 、 Soft x ray
摘要: Abstract In recent years much progress has been made in the field of spectromicroscopy, combination spectroscopy with lateral resolution. This method is applicated increasingly to problems biology, material and surface science. Different technical approaches will be outlined discussed respect their imaging spectroscopic properties. The scanning soft x-ray microscope at HASYLAB equipped continuously new operating modes now capability use photoelectrons, photodesorbed ions, luminescence, fluorescence, scattered transmitted photons for spectroscopy. Examinations artificial structures, luminescent ceramics crystals porous silicon presented.