Soft X-ray spectromicroscopy

作者: J. Voss , M. Fornefett , C. Kunz , A. Moewes , M. Pretorius

DOI: 10.1016/0368-2048(96)02986-6

关键词: LuminescencePhotoelectric effectSpectroscopyCeramicNanotechnologyOptoelectronicsPorous siliconMaterials scienceMicroscopePhotonSoft x ray

摘要: Abstract In recent years much progress has been made in the field of spectromicroscopy, combination spectroscopy with lateral resolution. This method is applicated increasingly to problems biology, material and surface science. Different technical approaches will be outlined discussed respect their imaging spectroscopic properties. The scanning soft x-ray microscope at HASYLAB equipped continuously new operating modes now capability use photoelectrons, photodesorbed ions, luminescence, fluorescence, scattered transmitted photons for spectroscopy. Examinations artificial structures, luminescent ceramics crystals porous silicon presented.

参考文章(34)
J Stöhr, Y Wu, BD Hermsmeier, MG Samant, GR Harp, S Koranda, D Dunham, BP Tonner, None, Element-Specific Magnetic Microscopy with Circularly Polarized X-rays Science. ,vol. 259, pp. 658- 661 ,(1993) , 10.1126/SCIENCE.259.5095.658
T. Komeda, G. D. Waddill, P. J. Benning, J. H. Weaver, Photoelectron microscopy and spectroscopy of Bi2Sr2-x- Ca1+xCu2O8+y(100). Physical Review B. ,vol. 43, pp. 8713- 8716 ,(1991) , 10.1103/PHYSREVB.43.8713
Sadao Aoki, Taro Ogata, Shuuzou Sudo, Tetsuji Onuki, Sub-100 nm-Resolution Grazing Incidence Soft X-Ray Microscope with a Laser-Produced Plasma Source Japanese Journal of Applied Physics. ,vol. 31, pp. 3477- 3480 ,(1992) , 10.1143/JJAP.31.3477
G. R. Morrison, M. T. Browne, Dark-field imaging with the scanning transmission x-ray microscope Review of Scientific Instruments. ,vol. 63, pp. 611- 614 ,(1992) , 10.1063/1.1143820
C. J. Buckley, The measuring and mapping of calcium in mineralized tissues by absorption difference imaging Review of Scientific Instruments. ,vol. 66, pp. 1318- 1321 ,(1995) , 10.1063/1.1145963
Shawn Williams, Chris Jacobsen, Janos Kirz, Jörg Maser, Sue Wirick, Xiaodong Zhang, Harald Ade, Mark Rivers, Instrumentation developments in scanning soft x‐ray microscopy at the NSLS (invited) Review of Scientific Instruments. ,vol. 66, pp. 1271- 1275 ,(1995) , 10.1063/1.1146020
Y. Nagata, H. Yamaji, K. Hayashi, K. Kawashima, K. Hyodo, H. Kawata, M. Ando, High energy high resolution monochromatic x‐ray computed tomography using the Photon Factory vertical wiggler beamline Review of Scientific Instruments. ,vol. 63, pp. 615- 618 ,(1992) , 10.1063/1.1142668
Masaki Hasegawa, Ken Ninomiya, Total photoelectron imaging of submicron stripe patterns using soft x‐ray microbeams formed by Wolter‐type mirrors Review of Scientific Instruments. ,vol. 66, pp. 1361- 1363 ,(1995) , 10.1063/1.1145975
Akira Takazawa, Tetsuro Tamura, Masao Yamada, Photoluminescence mechanisms of porous Si oxidized by dry oxygen Journal of Applied Physics. ,vol. 75, pp. 2489- 2495 ,(1994) , 10.1063/1.356247