Direct studies of domain switching dynamics in thin film ferroelectric capacitors
作者： A. Gruverman , B. J. Rodriguez , C. Dehoff , J. D. Waldrep , A. I. Kingon
DOI: 10.1063/1.2010605
关键词: Switching cycle 、 Materials science 、 Nucleation 、 Piezoelectricity 、 Capacitor 、 Optoelectronics 、 Polarization (waves) 、 Thin film 、 Piezoresponse force microscopy 、 Ferroelectricity
摘要: An experimental approach for direct studies of the polarization reversal mechanism in thin film ferroelectric capacitors based on piezoresponse force microscopy (PFM) conjunction with pulse switching capabilities is presented. Instant domain configurations developing a 3×3μm2 capacitor at different stages process have been registered using step-by-step and subsequent PFM imaging. The developed allows comparison experimentally measured microscopic behavior parameters used by phenomenological models. It has found that low field regime (just above threshold value) present study, changes during cycle from initial nucleation-dominated to lateral expansion later stages. classical nucleation model Kolmogorov–Avrami–Ishibashi (KAI) provides reasonable approximation stage switchi...
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