Dynamic and Spectroscopic Modes and Multivariate Data Analysis in Piezoresponse Force Microscopy
作者： B. J. Rodriguez , S. Jesse , K. Seal , N. Balke , S. V. Kalinin
DOI: 10.1007/978-1-4419-7167-8_17
关键词:
摘要: Nonvolatile bias-controlled polarization states in ferroelectric materials offer unique opportunities for information technology and data storage applications. The ability to probe properties at the nanoscale by piezoresponse force microscopy (PFM) has enabled fundamental studies of dynamics role defects disorder on domain nucleation wall motion led advances design implementation such This resulted development fast spectroscopic modes collect switching from every point an image. emergence fast, configurable processing electronics prompted dynamic nonsinusoidal acquisition methods PFM. Further, recent synergy necessitated multivariate analysis These applications PFM imaging spectroscopy processes will be discussed.
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