作者: R. I. Barabash , W. Donner , H. Dosch
DOI: 10.1063/1.1342215
关键词: Optics 、 Epitaxy 、 Condensed matter physics 、 Scattering 、 Momentum transfer 、 Niobium 、 Dislocation 、 Materials science 、 X-ray
摘要: We apply the Krivoglaz theory of x-ray scattering to thin epitaxial films containing misfit dislocations and reanalyze seemingly puzzling phenomena observed in several heteroepitaxial films. show that two-line shape distribution its dependence upon film thickness momentum transfer can be understood natural way on a quantitative level. Extended diffuse maps have been obtained from Nb(110)/Al2O3(1120) which are discussed within framework this disclose particular dislocation network at Nb–Al2O3 interface.