Specular and diffuse reflectivity from thin films containing misfit dislocations
作者： T. Krentsel , C.J. Palmstrøm , P.F. Miceli , J. Weatherwax
DOI: 10.1016/0921-4526(95)00930-2
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摘要: Abstract We discuss the effects of misfit dislocations on specular and diffuse scattering observed in X-ray reflectivity at Bragg reflections thin films. Using experimental results from ErAs/GaAs(001), it is shown that an interfacial displacement-difference correlation function can be used to model dislocations. find correlation-length-limited for weak disorder whereas has a rotational character strong disorder. It suggested length arises elastic image field dislocation.
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