Structural characterization of Nd-doped in silica host matrix prepared by wet chemical process

作者: Surender Duhan , Sunita Devi , M. Singh

DOI: 10.1016/S1002-0721(08)60196-9

关键词: NeodymiumAnnealing (metallurgy)Analytical chemistryMineralogyNanocrystalline materialInfrared spectroscopyScanning electron microscopeFourier transform infrared spectroscopySinteringAmorphous solidMaterials science

摘要: Abstract Silica host matrix containing neodymium which is potentially important for the formation of nanocrystalline metal oxides was prepared by solgel method, using tetra-ethoxysilane and Nd(NO 3 ) as precursor materials. The samples were changed from amorphous to nanocrystallites phase at sintered temperature 550 °C (4 h), 750 (8 h) 950 (12 h). thermally treated sample microstructures investigated X-ray diffraction (XRD), Fourier transformation infrared spectroscopy (FTIR), scanning electron microscopy (SEM). While a further increase annealing time resulted in cubic hexagonal Nd 2 O nanocrystallites. At constant sintering 12 h, showed sharper intense peaks. sizes characterized XRD with average size ∼46 nm.

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