作者: Michio Watamori , Fumiya Shoji , Kenjiro Oura
DOI: 10.1143/JJAP.33.6039
关键词: Superconductivity 、 Resonance 、 Cross section (physics) 、 Limiting oxygen concentration 、 Analytical chemistry 、 Elastic backscattering 、 Depth dependence 、 Oxygen 、 Materials science 、 Oxygen distribution 、 Molecular physics
摘要: The enhancement factor of oxygen 16O(α, α)16O resonance for a Rutherford backscattering cross section has been investigated using SiO2 films various thicknesses. A new procedure to accurately extract the resonant height from raw spectrum proposed. With this procedure, dependence between film thicknesses and signals investigated, was found agree well with computer simulation within experimental error. Using factor, depth concentration in YBa2Cu3Ox /MgO systems estimated accurately. Estimations accuracy elastic analysis are also given.