作者: Yuri Postolov , Menachem Regensburger , Roni Flieswasser
DOI:
关键词: Process (computing) 、 Quality (physics) 、 Reference image 、 Coincident 、 Controller (computing) 、 Artificial intelligence 、 Pixel 、 Reference model 、 Computer vision 、 Software 、 Computer science
摘要: A method and a system for preparing pattern's reference-model to be used automatic inspection of surface are disclosed. The according the present invention is comprised an imaging device that captured images plurality patters; dedicated software uses algorithms correct align images; controller operative collecting same located coincident pixel each choosing, predetermined criteria, one collected pixels; creating new image with dimensions as locating chosen in place corresponding pixels origin repeating process defined above providing created reference model inspecting pattern.