Appearance potential mass spectrometry: Discrimination of dissociative ionization products
作者： Harmeet Singh , J. W. Coburn , David B. Graves
DOI: 10.1116/1.582183
关键词: Ion source 、 Electron ionization 、 Thermal ionization 、 Ambient ionization 、 Chemical ionization 、 Ionization 、 Chemistry 、 Atmospheric-pressure laser ionization 、 Mass spectrometry 、 Analytical chemistry
摘要: Appearance potential mass spectrometry (APMS) has recently gained importance for detection and quantitative measurements of reactive radical species in plasmas using line-of-sight sampling radicals. In this work, we have investigated the assumption that extraction efficiency ions produced by direct ionization radicals, dissociative parent molecule used as reference signal, are equal ionizer spectrometer. We find products extracted with much lower (2–50 times smaller cases studied) than products. This is expected due to excess kinetic energy dissociatively ionized a result Franck–Condon effect. Use procedure will thus lead an overestimation number density factor 2–50, depending on nature daughter ion. recommend alternate APMS utilizes inert...
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B. Van Zyl, T. M. Stephen, Dissociative ionization of H2, N2, and O2 by electron impact. Physical Review A. ,vol. 50, pp. 3164- 3173 ,(1994) , 10.1103/PHYSREVA.50.3164
Frank A. Baiocchi, Robert C. Wetzel, Robert S. Freund, Electron-Impact Ionization and Dissociative Ionization of the C D 3 and C D 2 Free Radicals Physical Review Letters. ,vol. 53, pp. 771- 774 ,(1984) , 10.1103/PHYSREVLETT.53.771
H.U. Poll, C. Winkler, D. Margreiter, V. Grill, T.D. Märk, Discrimination effects for ions with high initial kinetic energy in a Nier-type ion source and partial and total electron ionization cross-sections of CF4 International Journal of Mass Spectrometry and Ion Processes. ,vol. 112, pp. 1- 17 ,(1992) , 10.1016/0168-1176(92)87029-E
Harmeet Singh, John W. Coburn, David B. Graves, Mass spectrometric detection of reactive neutral species: Beam-to-background ratio Journal of Vacuum Science and Technology. ,vol. 17, pp. 2447- 2455 ,(1999) , 10.1116/1.581981
P. H. Dawson, Quadrupole mass analyzers: performance, design and some recent applications Mass Spectrometry Reviews. ,vol. 5, pp. 1- 37 ,(1986) , 10.1002/MAS.1280050102
K. Stephan, H. Helm, T. D. Märk, Mass spectrometric determination of partial electron impact ionization cross sections of He, Ne, Ar and Kr from threshold up to 180 eV Journal of Chemical Physics. ,vol. 73, pp. 3763- 3778 ,(1980) , 10.1063/1.440606
Gowri P. Kota, J. W. Coburn, David B. Graves, The recombination of chlorine atoms at surfaces Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. ,vol. 16, pp. 270- 277 ,(1998) , 10.1116/1.580982
E Krishnakumar, S K Srivastava, Cross sections for the production of N2(+), N(+) + N2(2+) and N(2+) by electron impact on N2 Journal of Physics B. ,vol. 23, pp. 1893- 1903 ,(1990) , 10.1088/0953-4075/23/11/022
Gregory H. Wannier, The Threshold Law for Single Ionization of Atoms or Ions by Electrons Physical Review. ,vol. 90, pp. 817- 825 ,(1953) , 10.1103/PHYSREV.90.817
H. C. Straub, P. Renault, B. G. Lindsay, K. A. Smith, R. F. Stebbings, Absolute partial cross sections for electron-impact ionization of H2, N2, and O2 from threshold to 1000 eV Physical Review A. ,vol. 54, pp. 2146- 2153 ,(1996) , 10.1103/PHYSREVA.54.2146