Plasmon-ratio imaging: a technique for enhancing the contrast of second phases with reduced diffraction contrast in TEM micrographs.

作者: Graham J.C. Carpenter

DOI: 10.1017/S1431927604040772

关键词: PlasmonMaterials scienceDiffractionContrast (vision)Energy filtered transmission electron microscopyMicrographOpticsCrystalline materialsTransmission electron microscopyEnergy loss

摘要: A technique is proposed for reducing unwanted diffraction contrast when imaging second phases in crystalline materials using transmission electron microscopy. With the suggested name of plasmon-ratio imaging, uses an energy-filtered system to record and determine a ratio two images taken at energies low loss region. Unlike core-loss use very thin specimens not required. It concluded that it often possible create image which dominated by energy loss, is, chemical differences, rather than effects.

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