作者: Graham J.C. Carpenter
DOI: 10.1017/S1431927604040772
关键词: Plasmon 、 Materials science 、 Diffraction 、 Contrast (vision) 、 Energy filtered transmission electron microscopy 、 Micrograph 、 Optics 、 Crystalline materials 、 Transmission electron microscopy 、 Energy loss
摘要: A technique is proposed for reducing unwanted diffraction contrast when imaging second phases in crystalline materials using transmission electron microscopy. With the suggested name of plasmon-ratio imaging, uses an energy-filtered system to record and determine a ratio two images taken at energies low loss region. Unlike core-loss use very thin specimens not required. It concluded that it often possible create image which dominated by energy loss, is, chemical differences, rather than effects.